Integrated mini end window X-ray tube, large Si-PIN detector, high signal-to-noise ratio electronic component, and equivalent performance to desk-top X-ray Fluorescence Spectrometer
The sample chamber is in sealed round structure with good X-ray shielding capability.
Four groups of changeable filters; good results in full-element analysis and RoHS testing, different elements are measured corresponding their matrix materials.
PDA palm-top computer, wireless Bluetooth connection, light and convenient, with measurement data at hands 
Packing case, solid and water-proof, contrives an integrated design with the instrument; suitable for harsh outdoors environment
Large-capacity Lithium Battery, and long hours of independent work, or AC to DC adapter for AC power supply

EDX-Portable-Ⅰ

  • Measurable elements: K to U
    Range of element content: 1ppm-99.99%
    Measurable thinnest plating is 0.05um 
    Arbitrary optional analysis and identification models
    Independent matrix effect correction models
    Multi-variable non-linear regression procedure
    Repeatability: 0.1% 
    Stability: 0.1%

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