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Profilometer HOMMEL ETAMIC W20
The Hommel-Etamic W20 skidless probe system has been designed specifically for mobile roughness measurement. It not only measures all common roughness parameters, but also evaluates the waviness and total profile of your surface. The measuring instrument is particularly compact and portable. The built-in battery means that the device can be used even without an external power supply.

The measuring probe is automatically positioned on the surface. The motorized probe lowering function simplifies operation — you simply need to position the traverse unit and start the measurement. On completion of the measurement, the probe arm lifts up from the surface automatically. This protects the probe tip from damage.

The large color touchscreen is extremely clear to read and easy to operate. With the integrated printer, you can display your measurement results in graph form immediately. Parameters, profile graphics, Abbott curves and statistical data also can be displayed. The measuring instrument offers seven measuring programs, as well as the option to test with the integrated roughness standard.

Profilometer HOMMEL ETAMIC W20

  • Measuring principle Scattering method, calibration
    Total deviation according to DIN 4772 Class 1
    Feed Waveline™ 20
    Applicable buttons Reference button
    Sensing distance 20 mm
    Sensing direction Axial
    Working area About 360°
    Operating elements Integrated start button, inclination reference plane
    Taster (standard) TKL 300L, 2 µm/90°
    Measuring range ±300 µm
    Resolution 12 nm*
    Scanning distance
    According to ISO/JIS 1.5/4.8/15 mm
    According to Motif 0.64/3.2/16 mm
    Max. 20 mm
    Cut-off length cut-off  according to. DIN EN ISO 4288/JIS B601 0.08/0.25/0.8/2.5/8 mm
    Number of individual measuring sections 1 to n (max. sensing distance)
    Filter DIN EN ISO 11562: Gaussian filter DIN EN ISO 16610-21: Gaussian filter DIN EN ISO 13565-1: Filters for Rk characteristic values DIN EN ISO 3274: λs-Filter
    Touch speed 0.15/0.5/1 mm/s; return 3 mm/s
    Display 4.3“ TFT- colour display with touch screen function
    Roughness and profile parameters
    DIN EN ISO 4287 Ra, Rz, Rmax, Rt, Rq, RSm, Rc, Rp, Rv, Rsk, Rku, Rdc, Rdq, RzISO, Rmr, Rmr(c), C(Rmr), Pt, Pz, Pa, Pc, Pp, Pv, PSm, Pq, PSk, Pku, Pdq, Pdc, Pmr, Pmr(c), C(Pmr)
    DIN EN ISO 13565-1, -2 Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*
    Motif DIN EN ISO 12085 R, AR, Rx, CR, CF, CL, Nr
    ASME B46.1 Rp, Rpm
    JIS B601 (2001) Rz-JIS
    DIN EN 10049 RPc
    Daimler MBN 31007 R3z
    Specific characteristics Seal characteristic size Rmr (factor * characteristic)
    Ripple characteristics
    DIN EN ISO 4287 Wt, Wz, Wa, Wp, Wv, WSm, Wq, WSk, Wku, Wdq, Wc
    Motif DIN EN ISO 12085 W, Wx, Aw
    Battery (basic unit) Li-Ion battery, up to 800 measuring cycles (without print, stroke distance 4.8 mm), volume charge approx. 6 h
    Measuring programs 7 plus 1 for device testing
    Data memory (per measuring program) Max. 2000 Measurement records / characteristics and 500 profile records
    Interface USB
    Dimensions (L x W x H)
    Basic device 227 x 225 x 70 mm / 8.9 x 8.9 x 2.8 in
    Weight 1080 g / 2.4 lbs
    Feed (L x W x H) Waveline™ 20: 245 x 54 x 75 mm
    Weight 1100 g / 2.4 lbs
    Printer Integrated
    Printing process Static thermographic line
    Paper / print width 57 ±0.5 mm / 48 mm (1.9 in)
    Paper roll Ø = 31 mm (1.2 in)
    Resolution 8 dots / mm, 384 dots / line
    Printing functions Measurement conditions, parameters, roughness profile, Abbott curve, statistics
    Battery pack With basic device
    Interfaces With basic device
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