The Hommel Etamic W20 skidless probe system has been designed specifically for mobile roughness measurement. It not only measures all common roughness parameters, but also evaluates the waviness and total profile of your workpiece surfaces. The measuring instrument is particularly compact and portable. The built-in battery means that it can be used even without an external power supply.
The measuring probe is automatically positioned on the workpiece surface. The motorized probe lowering function simplifies operation — you simply need to position the traverse unit and start the measurement. On completion of the measurement, the probe arm lifts up from the workpiece automatically. This protects the probe tip from damage.
The large color touchscreen is extremely clear and easy to operate. With the integrated printer, you can display your measurement results in graph form immediately. Parameters, profile graphics, Abbott curves and statistical data can be displayed. The measuring instrument offers seven measuring programs, as well as the option to test it with the integrated roughness standard.
Surface Tester HOMMEL ETAMIC W20
Measuring principle Scattering method, calibration Total deviation according to DIN 4772 Class 1 Feed waveline™ 20 Applicable buttons Reference button Sensing distance 20 mm Sensing direction axial Working area about 360° Operating elements Integrated start button, inclination reference plane Taster (Standard) TKL 300L, 2 µm/90° Measuring range ±300 µm Resolution 12 nm* Scanning distance according to ISO/JIS 1.5/4.8/15 mm according to Motif 0.64/3.2/16 mm max. 20 mm Cut-off length cut-off according to. DIN EN ISO 4288/JIS B601 0.08/0.25/0.8/2.5/8 mm Number of individual measuring sections 1 to n (max. sensing distance) Filter DIN EN ISO 11562: Gaussian filter DIN EN ISO 16610-21: Gaussian filter DIN EN ISO 13565-1: Filters for Rk characteristic values DIN EN ISO 3274: λs-Filter Touch speed 0.15/0.5/1 mm/s; return 3 mm/s Display 4.3“ TFT- colour display with touch screen function